Aplicarea metodei Swanepoel la determinarea indicelui de refracţie al straturilor subţiri policristaline de ZnSxSe1-x [Articol]

Popa, Mihail

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dc.contributor.author	Popa, Mihail
dc.date.accessioned	2022-03-01T13:09:55Z
dc.date.available	2022-03-01T13:09:55Z
dc.date.issued	2016
dc.identifier.citation	Popa, Mihail. Aplicarea metodei Swanepoel la determinarea indicelui de refracţie al straturilor subţiri policristaline de ZnSxSe1-x / Mihail Popa // Conferinţa ştiinţifico-practică „Inovaţia: factor al dezvoltării social-economice”, 3 martie 2016. Secţia 1 : Ştiinţe economice ; Secţia 2 : Ştinţe exacte şi inginereşti. – Cahul : Univ. de Stat „B. P. Haşdeu” din Cahul, 2016. – P. 246-251. – ISBN 978-9975-88-012-1.
dc.identifier.uri	http://dspace.usarb.md:8080/jspui/handle/123456789/5484
dc.description.abstract	The transmission spectra of ZnSxSe1-x thin films have been investigated in the spectral range of wavelength 300-1750 nm. With the increase of the concentration of S and reducing the concentration of Se takes place displacement fundamental absorption edge to the smaller wavelength zone. From the transmission spectra, using the „envelope” method proposed by Swanepoel, the refractive index was determined. It is noted that the refractive index decreases both the with the increase of the wavelength of the used electromagnetic radiation, as well as with increasing coefficient x for each of the samples examined.	en
dc.language.iso	ro	ro
dc.publisher	USARB	ro
dc.rights	Attribution-NonCommercial-NoDerivatives 4.0 International	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/4.0/	*
dc.subject	straturi subţiri	ro
dc.subject	metoda Swanepoel	ro
dc.title	Aplicarea metodei Swanepoel la determinarea indicelui de refracţie al straturilor subţiri policristaline de ZnSxSe1-x [Articol]	ro
dc.type	Article	en