Analizele XRD, SEM şi AFM ale straturilor subţiri policristaline de ZnSxSe1-x

Abstract

ZnSxSe1-x thin films were prepared from the vacuum evaporated technique on the glass substrates using powders of ZnS and ZnSe. The analysis of the structure was carried out through the XRD method. The diffractograms established that ZnSxSe1-x thin films have a cubic structure, of type sphalerite zinc with a strong orientation of crystallites as the crystalline plane (111). The values found for cubic network parameter calculated from diffractograms are between a = 5.658-5.406 nm, the interplanar distance d111 = 3.270 - 3.120 nm, and the crystallite sizes D = 37.50 - 24.35 nm. The surface morphology of polycrystalline thin films ZnSxSe1-x was studied by SEM and AFM technics. The average crystallite size determined from the images varies between 40 and 20 nm.