Please use this identifier to cite or link to this item:
http://dspace.usarb.md:8080/jspui/handle/123456789/5484
Title: | Aplicarea metodei Swanepoel la determinarea indicelui de refracţie al straturilor subţiri policristaline de ZnSxSe1-x [Articol] |
Authors: | Popa, Mihail |
Keywords: | straturi subţiri metoda Swanepoel |
Issue Date: | 2016 |
Publisher: | USARB |
Citation: | Popa, Mihail. Aplicarea metodei Swanepoel la determinarea indicelui de refracţie al straturilor subţiri policristaline de ZnSxSe1-x / Mihail Popa // Conferinţa ştiinţifico-practică „Inovaţia: factor al dezvoltării social-economice”, 3 martie 2016. Secţia 1 : Ştiinţe economice ; Secţia 2 : Ştinţe exacte şi inginereşti. – Cahul : Univ. de Stat „B. P. Haşdeu” din Cahul, 2016. – P. 246-251. – ISBN 978-9975-88-012-1. |
Abstract: | The transmission spectra of ZnSxSe1-x thin films have been investigated in the spectral range of wavelength 300-1750 nm. With the increase of the concentration of S and reducing the concentration of Se takes place displacement fundamental absorption edge to the smaller wavelength zone. From the transmission spectra, using the „envelope” method proposed by Swanepoel, the refractive index was determined. It is noted that the refractive index decreases both the with the increase of the wavelength of the used electromagnetic radiation, as well as with increasing coefficient x for each of the samples examined. |
URI: | http://dspace.usarb.md:8080/jspui/handle/123456789/5484 |
Appears in Collections: | Articole |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
Popa_M_aplicarea.pdf | 923,26 kB | Adobe PDF | View/Open |
This item is licensed under a Creative Commons License