Determinarea din spectrele de reflexie a lărgimii benzii interzise a compuşilor semiconductori de tip ZnSxSe [Articol]

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DC Field	Value	Language
dc.contributor.author	Popa, Mihail	ro
dc.date.accessioned	2016-03-11T13:44:31Z	-
dc.date.available	2016-03-11T13:44:31Z	-
dc.date.issued	2015	-
dc.identifier.citation	Popa, Mihail. Determinarea din spectrele de reflexie a lărgimii benzii interzise a compuşilor semiconductori de tip ZnSxSe / Mihail Popa // Tradiţie şi inovare în cercetarea ştiinţifică, Ediţia a 5-a : Materialele Colloquia Professorum din 10 octombrie 2014. – Bălţi. – 2015. – P. 227-231.	ro
dc.identifier.uri	http://dspace.usarb.md:8080/jspui/handle/123456789/1671	-
dc.description.abstract	Spectroscopic technique is very useful for characterising semiconducting materials. We demonstrate here a new method for determination the energy band gap of thin fims from reflectance data.	en
dc.language.iso	ro	ro
dc.publisher	USARB	ro
dc.rights	Attribution-NonCommercial-NoDerivatives 4.0 Internațional	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/4.0/	*
dc.subject	reflection spectrum	en
dc.subject	absorbtion spectrum	en
dc.subject	a semiconductor band gap width	en
dc.subject	spectrophotometer	en
dc.subject	spectru de reflecţie	ro
dc.subject	spectrul de absorbţie	ro
dc.subject	o lăţime de bandă de semiconductoare decalaj	ro
dc.subject	spectrofotometru	ro
dc.title	Determinarea din spectrele de reflexie a lărgimii benzii interzise a compuşilor semiconductori de tip ZnSxSe [Articol]	ro
dc.type	Article	en
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