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DC Field | Value | Language |
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dc.contributor.author | Popa, Mihail | ro |
dc.date.accessioned | 2016-03-11T13:44:31Z | - |
dc.date.available | 2016-03-11T13:44:31Z | - |
dc.date.issued | 2015 | - |
dc.identifier.citation | Popa, Mihail. Determinarea din spectrele de reflexie a lărgimii benzii interzise a compuşilor semiconductori de tip ZnSxSe / Mihail Popa // Tradiţie şi inovare în cercetarea ştiinţifică, Ediţia a 5-a : Materialele Colloquia Professorum din 10 octombrie 2014. – Bălţi. – 2015. – P. 227-231. | ro |
dc.identifier.uri | http://dspace.usarb.md:8080/jspui/handle/123456789/1671 | - |
dc.description.abstract | Spectroscopic technique is very useful for characterising semiconducting materials. We demonstrate here a new method for determination the energy band gap of thin fims from reflectance data. | en |
dc.language.iso | ro | ro |
dc.publisher | USARB | ro |
dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 Internațional | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | * |
dc.subject | reflection spectrum | en |
dc.subject | absorbtion spectrum | en |
dc.subject | a semiconductor band gap width | en |
dc.subject | spectrophotometer | en |
dc.subject | spectru de reflecţie | ro |
dc.subject | spectrul de absorbţie | ro |
dc.subject | o lăţime de bandă de semiconductoare decalaj | ro |
dc.subject | spectrofotometru | ro |
dc.title | Determinarea din spectrele de reflexie a lărgimii benzii interzise a compuşilor semiconductori de tip ZnSxSe [Articol] | ro |
dc.type | Article | en |
Appears in Collections: | Articole |
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Popa. col. 2015. 227-231.PDF | 881,42 kB | Adobe PDF | View/Open |
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