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http://dspace.usarb.md:8080/jspui/handle/123456789/1671| Title: | Determinarea din spectrele de reflexie a lărgimii benzii interzise a compuşilor semiconductori de tip ZnSxSe [Articol] |
| Authors: | Popa, Mihail |
| Keywords: | reflection spectrum absorbtion spectrum a semiconductor band gap width spectrophotometer spectru de reflecţie spectrul de absorbţie o lăţime de bandă de semiconductoare decalaj spectrofotometru |
| Issue Date: | 2015 |
| Publisher: | USARB |
| Citation: | Popa, Mihail. Determinarea din spectrele de reflexie a lărgimii benzii interzise a compuşilor semiconductori de tip ZnSxSe / Mihail Popa // Tradiţie şi inovare în cercetarea ştiinţifică, Ediţia a 5-a : Materialele Colloquia Professorum din 10 octombrie 2014. – Bălţi. – 2015. – P. 227-231. |
| Abstract: | Spectroscopic technique is very useful for characterising semiconducting materials. We demonstrate here a new method for determination the energy band gap of thin fims from reflectance data. |
| URI: | http://dspace.usarb.md:8080/jspui/handle/123456789/1671 |
| Appears in Collections: | Articole |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Popa. col. 2015. 227-231.PDF | 881,42 kB | Adobe PDF |  View/Open |
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