Please use this identifier to cite or link to this item: http://dspace.usarb.md:8080/jspui/handle/123456789/1671
Title: Determinarea din spectrele de reflexie a lărgimii benzii interzise a compuşilor semiconductori de tip ZnSxSe
Authors: Popa, Mihail
Keywords: reflection spectrum
absorbtion spectrum
a semiconductor band gap width
spectrophotometer
spectru de reflecţie
spectrul de absorbţie
o lăţime de bandă de semiconductoare decalaj
spectrofotometru
Issue Date: 2015
Publisher: USARB
Citation: Popa, Mihail. Determinarea din spectrele de reflexie a lărgimii benzii interzise a compuşilor semiconductori de tip ZnSxSe / Mihail Popa // Tradiţie şi inovare în cercetarea ştiinţifică, Ediţia a 5-a : Materialele Colloquia Professorum din 10 octombrie 2014. – Bălţi. – 2015. – P. 227-231.
Abstract: Spectroscopic technique is very useful for characterising semiconducting materials. We demonstrate here a new method for determination the energy band gap of thin fims from reflectance data.
URI: http://hdl.handle.net/123456789/1671
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