Please use this identifier to cite or link to this item:
Full metadata record
DC FieldValueLanguage
dc.contributor.authorPopa, Mihail-
dc.identifier.citationPopa, Mihail. Prepararea şi cercetarea proprietăţilor structurale ale straturilor subţiri policristaline de ZnSxSe / Mihail Popa // Tradiţie şi inovare în cercetarea ştiinţifică, Ediţia a 5-a : Materialele Colloquia Professorum din 10 octombrie 2014. – Bălţi. – 2015. – P.
dc.description.abstractZnSxSe1-x thin films were prepared from evaporated technique on the glass substrates using powders of ZnS and ZnSe. Structure analysis of the thin films had been perfected from XRD technique, morphology of surface had been obtained from SEM and the composition of the thin films was carried out by using EDAX techniques. Diffraction patents determined that ZnSxSe1-x thin layers have a cubic structure of zinc blended type, with a strong orientation of the crystallite after the crystalline plane (111). The lattice parameter of the ZnSxSe1-x thin films ranges from the value a = 5,63246Å ( for x = 0) up to a = 5,41607Å (x = 1), and the crystallite size determined by X-ray diffraction patterns are comprised between 13.526 Å and 5,304Å. Images EDAX confirm predetermined composition of components.en
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internațional*
dc.subjectthin filmsen
dc.subjectcubic structureen
dc.subjectX-ray diffractionen
dc.subjectscanning electron microscopyen
dc.subjectstraturi subţiri policristalinero
dc.subjectstructura cubicăro
dc.subjectdifracţie de raze Xro
dc.subjectmicroscopie electronică de baleajro
dc.titlePrepararea şi cercetarea proprietăţilor structurale ale straturilor subţiri policristaline de ZnSxSe [Articol]ro
Appears in Collections:Articole

Files in This Item:
File Description SizeFormat 
Popa_Prepararea.PDF1,32 MBAdobe PDFThumbnail

This item is licensed under a Creative Commons License Creative Commons