Please use this identifier to cite or link to this item: http://dspace.usarb.md:8080/jspui/handle/123456789/1669
Title: Prepararea şi cercetarea proprietăţilor structurale ale straturilor subţiri policristaline de ZnSxSe
Authors: Popa, Mihail
Keywords: thin films
cubic structure
X-ray diffraction
scanning electron microscopy
straturi subţiri policristaline
structura cubică
difracţie de raze X
microscopie electronică de baleaj
Issue Date: 2015
Publisher: USARB
Citation: Popa, Mihail. Prepararea şi cercetarea proprietăţilor structurale ale straturilor subţiri policristaline de ZnSxSe / Mihail Popa // Tradiţie şi inovare în cercetarea ştiinţifică, Ediţia a 5-a : Materialele Colloquia Professorum din 10 octombrie 2014. – Bălţi. – 2015. – P. 217-222.
Abstract: ZnSxSe1-x thin films were prepared from evaporated technique on the glass substrates using powders of ZnS and ZnSe. Structure analysis of the thin films had been perfected from XRD technique, morphology of surface had been obtained from SEM and the composition of the thin films was carried out by using EDAX techniques. Diffraction patents determined that ZnSxSe1-x thin layers have a cubic structure of zinc blended type, with a strong orientation of the crystallite after the crystalline plane (111). The lattice parameter of the ZnSxSe1-x thin films ranges from the value a = 5,63246Å ( for x = 0) up to a = 5,41607Å (x = 1), and the crystallite size determined by X-ray diffraction patterns are comprised between 13.526 Å and 5,304Å. Images EDAX confirm predetermined composition of components.
URI: http://hdl.handle.net/123456789/1669
Appears in Collections:Articole

Files in This Item:
File Description SizeFormat 
Popa. col.2015. 217-222.PDF1,28 MBAdobe PDFThumbnail
View/Open


This item is licensed under a Creative Commons License Creative Commons